Lafayette, CA, United States of America

Aram Yegiazaryan

This inventor holds 1 USPTO granted patent and 1 published patent application. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Aram Yegiazaryan. Retrieved from https://idiyas.com/inventor/aram-yegiazaryan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 13.0

ph-index = 1


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Aram Yegiazaryan: Innovator in Quality Assurance for 3D Objects

Introduction

Aram Yegiazaryan is a notable inventor based in Lafayette, CA (US). He has made significant contributions to the field of three-dimensional object manufacturing. His innovative approach focuses on quality assurance in the formation of these objects.

Latest Patents

Yegiazaryan holds a patent for "Quality assurance in formation of three-dimensional objects." This patent encompasses methods, apparatuses, and non-transitory computer-readable media that address quality assurance in the manufacturing of three-dimensional objects. The invention considers multiple variables to assess the performance of manufacturing mechanisms, such as printers, and the quality of the formed objects.

Career Highlights

Throughout his career, Yegiazaryan has demonstrated a commitment to enhancing the manufacturing process of three-dimensional objects. His work has paved the way for improved quality assurance measures in this rapidly evolving field.

Collaborations

Yegiazaryan has collaborated with notable individuals in his field, including Benyamin Buller and Gregory Ferguson Brown. These partnerships have contributed to the advancement of his innovative ideas and patents.

Conclusion

Aram Yegiazaryan's contributions to quality assurance in three-dimensional object manufacturing highlight his role as a significant inventor in this domain. His patent and collaborative efforts reflect his dedication to innovation and excellence in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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