This inventor holds 1 USPTO granted patent. Top assignee: Sri International. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: Innovations by Aparna Taneja
Introduction
Aparna Taneja is an accomplished inventor based in New Delhi, India. She has made significant contributions to the field of object detection through her innovative patent. Her work focuses on enhancing the safety and security of environments by detecting potential threats.
Latest Patents
Aparna Taneja holds a patent for a "System and method of detecting objects." This invention provides a system and method for segmenting and detecting objects that can be approximated by planar or nearly planar surfaces. The method involves capturing imagery of the scene near a platform, producing a depth map from the imagery, and tessellating the depth map into several patches. It classifies these patches as threat patches and projects them into a pre-generated vertical support histogram. This facilitates the selection of projected threat patches that meet a sufficiency criterion. The method further includes grouping selected patches using a plane fit to obtain a region of interest and processing this region to detect the object.
Career Highlights
Aparna Taneja is associated with Sri International, where she applies her expertise in developing advanced detection systems. Her innovative approach has positioned her as a key player in her field.
Collaborations
Aparna has collaborated with notable colleagues, including Theodore Armand Camus and Mayank Bansal. These collaborations have further enriched her work and contributed to the advancement of technology in object detection.
Conclusion
Aparna Taneja's contributions to the field of object detection through her innovative patent demonstrate her commitment to enhancing safety and security. Her work continues to inspire advancements in technology and innovation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
