Santa Clara, CA, United States of America

Aparna Ganti

This inventor holds 1 USPTO granted patent. Top assignee: Servicenow, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Aparna Ganti. Retrieved from https://idiyas.com/inventor/aparna-ganti

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 10.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Aparna Ganti

Introduction

Aparna Ganti is a notable inventor based in Santa Clara, CA. She has made significant contributions to the field of technology, particularly in database accuracy. Her work is characterized by a focus on enhancing the reliability of persistent storage systems.

Latest Patents

Aparna holds a patent titled "Smart detection for determination of database accuracy." This invention involves a system that utilizes configuration items (CIs) to ensure that data sources used for updates are trustworthy. The patent outlines a method for identifying CIs for auto-attestation and determining their conditions based on data-source attributes and update timelines. This innovative approach marks CIs as auto-attested or not, depending on their respective conditions.

Career Highlights

Aparna Ganti is currently employed at ServiceNow, Inc., where she continues to develop her expertise in technology and innovation. Her work at ServiceNow has allowed her to explore various aspects of database management and accuracy.

Collaborations

Aparna collaborates with talented individuals such as Lilia Manguy and Akhilesh Kashyap Kittane Ravikumar. These collaborations enhance her work and contribute to the innovative environment at ServiceNow.

Conclusion

Aparna Ganti is a remarkable inventor whose contributions to database accuracy are noteworthy. Her patent and work at ServiceNow reflect her commitment to innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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