Wuhan, China

Aoran Luo

This inventor holds 1 USPTO granted patent. Top assignee: Hubei University. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Aoran Luo. Retrieved from https://idiyas.com/inventor/aoran-luo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Aoran Luo - Innovator in Intrusion Detection Technology

Introduction

Aoran Luo is a notable inventor based in Wuhan, China. He has made significant contributions to the field of intrusion detection through his innovative methods and algorithms. His work focuses on enhancing the accuracy and efficiency of detecting intrusions in various systems.

Latest Patents

Aoran Luo holds a patent for an "Intrusion detection method based on improved immune network algorithm." This patent, which falls under the technical field of intrusion detection, outlines a method that includes several steps: initializing an antibody group, calculating affinities between antigens and antibodies, and determining a boundary antibody set. The method aims to achieve high detection accuracy while maintaining a low false alarm rate.

Career Highlights

Aoran Luo is affiliated with Hubei University, where he continues to advance his research in intrusion detection technologies. His work has garnered attention for its practical applications and innovative approach to solving complex problems in cybersecurity.

Collaborations

Aoran has collaborated with colleagues such as Chao Yang and Beijun Li, contributing to a dynamic research environment that fosters innovation and development in the field.

Conclusion

Aoran Luo's contributions to intrusion detection technology exemplify the impact of innovative thinking in addressing modern cybersecurity challenges. His patent reflects a commitment to improving detection methods, which is crucial in today's digital landscape.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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