Osaka, Japan

Aoi Kariya

This inventor holds 1 USPTO granted patent. Top assignees: Digital Printing & Solutions Co., Ltd., Meiji University, Shinsei Printing Co., Ltd.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Aoi Kariya. Retrieved from https://idiyas.com/inventor/aoi-kariya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Aoi Kariya: Innovator in Object Recognition Technology.

Introduction

Aoi Kariya is a prominent inventor based in Osaka, Japan. He has made significant contributions to the field of object recognition technology. His innovative work has led to the development of a novel object recognition system that enhances the accuracy of identifying objects.

Latest Patents

Aoi Kariya holds 1 patent for his invention titled "Object recognition system, and object recognition method." This patent describes a system that can more appropriately specify objects, even when similar objects are present. The system estimates which registered object in a database is the target object in an image captured by a user.

Career Highlights

Throughout his career, Aoi Kariya has worked with notable institutions, including Meiji University and Shinsei Printing Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to advancements in technology.

Collaborations

Aoi Kariya has collaborated with talented individuals such as Ryusuke Miyamoto and Motoki Takematsu. These partnerships have fostered innovation and creativity in his projects.

Conclusion

Aoi Kariya's work in object recognition technology exemplifies the impact of innovative thinking in solving complex problems. His contributions continue to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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