Bengaluru, India

Anunay Srivastava

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anunay Srivastava. Retrieved from https://idiyas.com/inventor/anunay-srivastava

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Anunay Srivastava and Low-Light Imaging Innovation.

Introduction

Anunay Srivastava is an inventor based in Bengaluru, India. His work includes a patent for improving low-light images captured by a multi-camera system. He is associated with Samsung Electronics Ltd.

Latest Patents

Srivastava is named on 1 patent, titled “Methods and Systems for Enhancing Low Light Frame in a Multi Camera System.” The invention describes identifying low-light conditions in a preview frame using predefined parameters. When low light is detected, a secondary camera captures another preview frame with a longer exposure time and either a wider or equivalent field of view. The system then generates an output frame using both previews and at least one of the predefined parameters.

Career Highlights

The patent reflects work on combining images from multiple cameras to enhance media captured in challenging lighting. The described approach uses information from frames with different exposure characteristics to produce an improved output.

Collaborations

Rahul Varna and Akshit Agarwal are listed as Srivastava’s coworkers. The available information does not specify their roles in the patent or their contributions to the invention.

Conclusion

Anunay Srivastava’s patent addresses low-light image enhancement through coordinated capture and processing across multiple cameras, highlighting an innovation associated with his work at Samsung Electronics Ltd.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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