FI

Antti Aalto

This inventor holds 0 USPTO granted patents, plus 1 CIPO patent.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Antti Aalto. Retrieved from https://idiyas.com/inventor/antti-aalto-6plo4wym

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Loading Chart...

Title: Antti Aalto: Innovator in Thermal Measurement Technologies

Introduction

Antti Aalto is a notable inventor from Finland, recognized for his contributions to the field of thermal measurement technologies. His innovative approach focuses on measuring temperature, molecular number density, and pressure of gaseous compounds using advanced thermal devices.

Latest Patents

Antti Aalto holds a patent titled "A Method For Measuring Temperature, Molecular Number Density, AND/OR Pressure Of A Gaseous Compound From A Thermal Device, And A Thermal System." This method involves generating a pulse sequence of light, guiding it into a thermal device, and measuring the intensity of scattered light at different wavelength bands. The process allows for the determination of critical information regarding the gaseous compound being analyzed.

Career Highlights

Antti Aalto is currently employed at Valmet Power Oy, where he applies his expertise in thermal systems. His work contributes significantly to advancements in measuring technologies, enhancing the efficiency and accuracy of thermal devices.

Collaborations

Antti collaborates with esteemed colleagues such as Juha Toivonen and Matti Saren, who share his commitment to innovation in thermal measurement.

Conclusion

Antti Aalto's work exemplifies the intersection of innovation and practical application in thermal measurement technologies. His contributions are vital for the ongoing development of efficient measurement systems in various scientific fields.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…