This inventor holds 1 USPTO granted patent. Top assignee: Consiglio Nazionale Delle Ricerche. Active years: 2008.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2008
Title: Antonella Branca: Innovator in Measurement Systems
Introduction
Antonella Branca is a distinguished inventor based in Bari, Italy. She has made significant contributions to the field of measurement systems, particularly through her innovative patent. Her work exemplifies the intersection of technology and practical application, showcasing her expertise and dedication to advancing measurement methodologies.
Latest Patents
Antonella Branca holds a patent for a "System and method for the measurement of the relative position of an object with respect to a point of reference." This invention involves acquiring a plurality of images, each adapted to display a point of reference. The process includes recognizing the object within each image using a classifier trained with examples, ultimately computing the relative position of the object concerning the reference point. This patent highlights her innovative approach to solving complex measurement challenges.
Career Highlights
Branca is affiliated with the National Research Council of Italy (Consiglio Nazionale Delle Ricerche), where she continues to develop her research and inventions. Her career is marked by a commitment to advancing technology in measurement systems, contributing to both academic and practical applications.
Collaborations
Some of her notable coworkers include Ettore Stella and Nicola Ancona, who collaborate with her on various research projects. Their combined expertise enhances the innovative environment in which they work.
Conclusion
Antonella Branca's contributions to measurement systems through her patent and collaborative efforts underscore her role as a leading inventor in her field. Her work not only advances technology but also inspires future innovations in measurement methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
