Company Filing History:
Years Active: 2015-2020
Title: Anton Vogl: Innovator in Semiconductor Measurement Technologies
Introduction
Anton Vogl is a notable inventor based in Sinzing, Germany. He has made significant contributions to the field of semiconductor technology, holding a total of 5 patents. His work primarily focuses on methods and devices for measuring and inspecting semiconductor chips and optoelectronic components.
Latest Patents
One of Anton Vogl's latest patents is a method and device for the measurement of a plurality of semiconductor chips in a wafer array. This invention discloses a method for measuring semiconductor chips arranged on an electrically conductive carrier. The method involves applying a voltage between a contact structure and the carrier, allowing for the measurement of the semiconductor chips based on luminous images generated by emitted radiation.
Another significant patent is a method and device for inspecting an optoelectronic component arranged on a connection board. This invention includes exciting an electromagnetic resonant circuit formed by the optoelectronic component and the connection board. The method involves applying an electrical alternating voltage to generate a temporally variable electromagnetic alternating field, which facilitates the emission of electromagnetic radiation from the optoelectronic component.
Career Highlights
Throughout his career, Anton Vogl has worked with prominent companies in the semiconductor industry, including Osram Opto Semiconductors GmbH and Osram OLED GmbH. His experience in these organizations has contributed to his expertise in semiconductor technologies and innovations.
Collaborations
Anton has collaborated with notable colleagues such as Roland Zeisel and Robert Schulz. Their combined efforts have further advanced the field of semiconductor measurement and inspection technologies.
Conclusion
Anton Vogl's contributions to semiconductor technology through his innovative patents and collaborations highlight his role as a significant inventor in this field. His work continues to influence advancements in measurement and inspection methods for semiconductor chips and optoelectronic components.