Company Filing History:
Years Active: 2018
Title: Anton Riley: Innovator in Multi-Tip Scanning Probe Microscopy
Introduction
Anton Riley is a notable inventor based in Santa Ynez, California. He has made significant contributions to the field of microscopy, particularly through his innovative patent related to multi-tip scanning probe microscopy. His work has implications for enhancing the precision and efficiency of imaging techniques.
Latest Patents
Anton Riley holds a patent for a "Method for calibrating and imaging using multi-tip scanning probe microscope." This patent describes systems, methods, and program products designed for the calibration and scanning of multiple Atomic Force Microscopy (AFM) probe heads used together for synchronous scanning. The automated calibration process utilizes scan data from multiple AFM probe heads to calibrate the system and position the probe heads at relative offset positions that are successively closer and more precise. The technique allows for simultaneous scanning of multiple heads to produce scan images, which are evaluated to recognize common features. This process enables the calculation of relative offsets of the images, allowing for accurate positioning of each probe tip.
Career Highlights
Anton Riley is associated with Fei Company, where he applies his expertise in microscopy and imaging technologies. His innovative approach has led to advancements in the calibration processes used in multi-tip scanning systems. His work is instrumental in improving the accuracy and efficiency of imaging techniques in various applications.
Collaborations
Anton collaborates with talented individuals in his field, including Sean Dale Zumwalt and Jordan Fine. Their combined efforts contribute to the ongoing development and refinement of advanced microscopy techniques.
Conclusion
Anton Riley's contributions to the field of multi-tip scanning probe microscopy exemplify the impact of innovative thinking in scientific research. His patent and work at Fei Company highlight the importance of precision in imaging technologies.