Munich, Germany

Anton Brandl

This inventor holds 1 USPTO granted patent. Top assignee: Varjo Technologies Oy. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anton Brandl. Retrieved from https://idiyas.com/inventor/anton-brandl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Anton Brandl: Innovator in 3D Reconstruction Technology

Introduction

Anton Brandl is a notable inventor based in Munich, Germany. He has made significant contributions to the field of three-dimensional (3D) reconstruction technology. His innovative approach has the potential to enhance various applications in imaging and visualization.

Latest Patents

Anton Brandl holds a patent for a method and system for enabling exposure-guided three-dimensional reconstruction. This patent outlines a comprehensive process that includes receiving a Low Dynamic Range (LDR) input image captured by a camera. It also involves rendering a High Dynamic Range (HDR) image corresponding to the input image, applying tone-mapping, and determining loss functions to improve the quality of the reconstructed image. His work in this area is crucial for advancing HDR image reconstruction techniques.

Career Highlights

Anton Brandl is currently associated with Varjo Technologies Oy, a company known for its cutting-edge developments in visual technology. His role at Varjo Technologies allows him to apply his expertise in 3D reconstruction and contribute to innovative projects that push the boundaries of imaging technology.

Collaborations

Due to space constraints, the collaborations section has been omitted.

Conclusion

Anton Brandl's contributions to 3D reconstruction technology exemplify the impact of innovative thinking in the field of imaging. His patent and work at Varjo Technologies highlight his commitment to advancing technology in meaningful ways.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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