Zurich, Switzerland

Anthony Vianna

This inventor holds 1 USPTO granted patent. Top assignee: Hexagon Metrology Gmbh. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anthony Vianna. Retrieved from https://idiyas.com/inventor/anthony-vianna

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: The Innovations of Anthony Vianna

Introduction

Anthony Vianna is a notable inventor based in Zurich, Switzerland. He has made significant contributions to the field of technology, particularly with his innovative scanning device. His work exemplifies the spirit of invention and the pursuit of excellence in engineering.

Latest Patents

Anthony Vianna holds a patent for a scanning device, showcasing his ability to create solutions that meet modern technological needs. This patent reflects his commitment to advancing the capabilities of scanning technology.

Career Highlights

Vianna is currently employed at Hexagon Metrology GmbH, a company known for its precision measurement solutions. His role at Hexagon Metrology allows him to apply his inventive skills in a practical setting, contributing to the company's reputation for innovation.

Collaborations

Throughout his career, Anthony has collaborated with talented individuals such as Gerald Gerent and Dongmei Hong. These partnerships have likely enriched his work and fostered a creative environment for innovation.

Conclusion

Anthony Vianna's contributions to technology through his patent and work at Hexagon Metrology GmbH highlight his role as a significant inventor in the field. His dedication to innovation continues to inspire others in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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