Walla Walla, WA, United States of America

Anthony Vannelli

This inventor holds 1 USPTO granted patent. Top assignee: Key Technology Corporation. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anthony Vannelli. Retrieved from https://idiyas.com/inventor/anthony-vannelli

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 37(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Anthony Vannelli

Introduction

Anthony Vannelli is a notable inventor based in Walla Walla, WA (US). He has made significant contributions to the field of product inspection technology. His work focuses on enhancing the quality inspection processes through innovative methods and apparatus.

Latest Patents

Vannelli holds a patent for a product inspection method and apparatus. This invention describes an automated quality inspection station designed to evaluate color component characteristics of a product. The inspection station utilizes a color video camera to capture video frames of product images. A control system analyzes these video frames, performing reference and sample calibrations to ensure accurate evaluations.

Career Highlights

Vannelli's career is marked by his dedication to improving product quality through technological advancements. His patent reflects his commitment to innovation in the field of automated inspection systems. He has successfully developed methods that streamline the inspection process, making it more efficient and reliable.

Collaborations

Vannelli works at Key Technology Corporation, where he collaborates with other professionals in the field. One of his notable coworkers is Thomas C Madsen, with whom he shares insights and expertise in product inspection technologies.

Conclusion

Anthony Vannelli's contributions to the field of product inspection are noteworthy. His innovative patent demonstrates his ability to enhance quality control processes through technology. His work continues to influence the industry and improve product evaluation methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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