Richland, MI, United States of America

Anthony Michael Deleo

This inventor holds 1 USPTO granted patent. Top assignee: Sanford Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anthony Michael Deleo. Retrieved from https://idiyas.com/inventor/anthony-michael-deleo-3ndfl3sm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovative Journey of Anthony Michael Deleo

Introduction

Anthony Michael Deleo is a notable inventor based in Richland, MI (US). He has made significant contributions to the field of technology, particularly with his innovative work in label printing. His dedication to invention has led to the development of a patent that showcases his expertise and creativity.

Latest Patents

Anthony holds a patent for a label printer, which reflects his commitment to enhancing efficiency in labeling processes. This invention is a testament to his ability to identify needs in the market and create solutions that address those needs. He has 1 patent to his name, highlighting his contributions to the field.

Career Highlights

Currently, Anthony is employed at Sanford GmbH, where he continues to innovate and develop new technologies. His role at the company allows him to collaborate with other talented professionals and contribute to the advancement of labeling technology.

Collaborations

Some of his coworkers include Mark Schoolmeester and David Matthew Scozzari. Their collaboration fosters a creative environment that encourages the exchange of ideas and the development of new inventions.

Conclusion

Anthony Michael Deleo's journey as an inventor exemplifies the spirit of innovation. His work in label printing and his collaboration with talented colleagues at Sanford GmbH position him as a key player in the field of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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