Chicago, IL, United States of America

Anthony L Meier

This inventor holds 1 USPTO granted patent. Top assignee: Northwestern University. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anthony L Meier. Retrieved from https://idiyas.com/inventor/anthony-l-meier

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: The Innovations of Anthony L Meier

Introduction

Anthony L Meier is a notable inventor based in Chicago, IL (US). He has made significant contributions to the field of electro-optic technology. His work primarily focuses on devices that enhance the performance of optical systems.

Latest Patents

Anthony L Meier holds 1 patent for his invention related to electro-optic modulator devices and related waveguide components comprising BaTiO films. This innovation showcases his expertise in developing advanced materials for optical applications.

Career Highlights

Currently, Anthony L Meier is affiliated with Northwestern University, where he continues to engage in research and development. His academic background and professional experience have positioned him as a key figure in his field.

Collaborations

Throughout his career, Anthony has collaborated with esteemed colleagues such as Bruce W Wessels and Pingsheng Tang. These partnerships have further enriched his research endeavors and contributed to the advancement of technology in his area of expertise.

Conclusion

Anthony L Meier's contributions to electro-optic technology exemplify the impact of innovative thinking in academia. His work continues to inspire future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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