This inventor holds 1 USPTO granted patent. Top assignee: Aluminum Company of America. Active years: 1997.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1997
Title: Innovations by Anthony J Tomasello
Introduction
Anthony J Tomasello is an accomplished inventor based in Schaumburg, IL (US). He has made significant contributions to the field of measurement technology, particularly in the automotive sector. His innovative approach has led to the development of a unique system for gauging the thickness of contoured objects.
Latest Patents
One of Tomasello's notable patents is titled "System and method for contactlessly gauging the thickness of a contoured object." This patent describes a system designed to visually measure the cross-sectional thickness of light-reflective objects, such as vehicle wheels. The system utilizes a means for transmitting a line of light onto each curved surface of the object, allowing for accurate measurement. It includes components for sensing the reflected light and producing signals that represent the linear profile of each surface. Additionally, the system can compare these profiles to calculate the object's thickness at various points. The method also encompasses inspecting vehicle wheels to ensure they meet dimensional specifications.
Career Highlights
Tomasello is associated with the Aluminum Company of America, where he applies his expertise in measurement technology. His work has been instrumental in enhancing the accuracy and efficiency of thickness gauging in automotive applications.
Collaborations
Throughout his career, Tomasello has collaborated with notable colleagues, including Louis G Willoughby, Jr and Donald G Jordan. These partnerships have contributed to the advancement of innovative solutions in the industry.
Conclusion
Anthony J Tomasello's contributions to the field of measurement technology exemplify the spirit of innovation. His patented system for gauging thickness has the potential to significantly impact the automotive industry. His work continues to inspire advancements in measurement techniques and technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
