Chantilly, CA, United States of America

Anthony Crego

This inventor holds 1 USPTO granted patent. Top assignee: Decision Sciences International Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anthony Crego. Retrieved from https://idiyas.com/inventor/anthony-crego-mpk50e6p

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Anthony Crego

Introduction

Anthony Crego is a notable inventor based in Chantilly, California. He has made significant contributions to the field of imaging technology, particularly through his innovative patent. His work focuses on enhancing the capabilities of charged particle detectors, which have applications in various industrial settings.

Latest Patents

Crego holds a patent for a system and methods of charged particle detectors for blast furnace imaging. This technology utilizes high-energy charged particles to create detailed images of objects, such as blast furnaces. The patented method involves moving particle tracking detectors both vertically and horizontally around the blast furnace. By receiving incoming and outgoing charged particles, the system processes electrical signals to produce images of specific volumes of interest.

Career Highlights

Anthony Crego is associated with Decision Sciences International Corporation, where he applies his expertise in imaging technology. His work has contributed to advancements in the field, showcasing his commitment to innovation and practical applications of his inventions.

Collaborations

Crego collaborates with Sean Simon, a fellow professional in the industry. Their partnership enhances the development and implementation of advanced imaging technologies.

Conclusion

Anthony Crego's contributions to imaging technology through his patent demonstrate his innovative spirit and dedication to improving industrial processes. His work continues to influence the field and showcases the importance of advancements in charged particle detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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