This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2000.
Company Filing History:
Years Active: 2000
Title: Innovations of Anthonty P Ingraham
Introduction
Anthonty P Ingraham is a notable inventor based in Endicott, NY (US). He has made significant contributions to the field of integrated circuit testing. His innovative approach has led to advancements that enhance the reliability and efficiency of electronic components.
Latest Patents
Ingraham holds a patent for a "Method and apparatus for testing integrated circuit chips." This invention involves the formation of a contact probe with a pattern of dendritic textured contacts that are complementary to the contact pad array on a bare chip. This design allows for simultaneous temporary connections to all contact pads of the bare chip with a significantly reduced compressional force. The reliability of these connections enables screening, burn-in, and full functional testing of the bare chip at high throughput. This innovation aims to exploit potential economies of 'known good die' (KGD) processing, which helps limit or avoid the repair and rework of less than fully functional chips in complex electronic packages.
Career Highlights
Ingraham is associated with the International Business Machines Corporation (IBM), where he has contributed to various projects and innovations. His work has been instrumental in advancing the technology used in integrated circuits and electronic testing.
Collaborations
Ingraham has collaborated with notable coworkers such as Robert R Cadieux and George Charles Correia. Their combined expertise has fostered an environment of innovation and technological advancement.
Conclusion
Anthonty P Ingraham's contributions to the field of integrated circuit testing exemplify the impact of innovative thinking in technology. His patent and work at IBM highlight the importance of reliability and efficiency in electronic components.