Hawthorne, CA, United States of America

Ann E Inguanzo

This inventor holds 1 USPTO granted patent. Top assignee: Raytheon Company. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ann E Inguanzo. Retrieved from https://idiyas.com/inventor/ann-e-inguanzo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Innovations by Ann E Inguanzo

Introduction

Ann E Inguanzo is a notable inventor based in Hawthorne, CA (US). She has made significant contributions to the field of embedded systems, particularly in testing and debugging methodologies. Her work has implications for various industries that rely on embedded controllers.

Latest Patents

Ann E Inguanzo holds 1 patent for her invention titled "Systems and methods for testing an embedded controller." This patent describes a testing architecture that allows for the simulation of messaging interfaces between internal subsystems of an embedded controller and external subsystems. The architecture facilitates the integration of various types of software, enhancing the efficiency of testing processes.

Career Highlights

Ann is currently employed at Raytheon Company, where she applies her expertise in embedded systems. Her role involves developing innovative solutions that improve the reliability and functionality of embedded controllers.

Collaborations

Throughout her career, Ann has collaborated with talented professionals, including Terence J McKiernan and Danny D Nguyen. These collaborations have contributed to the advancement of technology in her field.

Conclusion

Ann E Inguanzo's work exemplifies the importance of innovation in embedded systems. Her contributions continue to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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