Karnataka, India

Anjana AR

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Siemens Aktiengesellschaft. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anjana AR. Retrieved from https://idiyas.com/inventor/anjana-ar-qohdwcu7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Anjana AR and Process Bus Measurement Accuracy.

Introduction

Anjana AR is an inventor associated with Karnataka, India, and Siemens Aktiengesellschaft. Her patent work addresses measurement error reduction in process bus systems.

Latest Patents

Anjana AR is associated with 1 patent, titled “Measurement Error Reduction in a Process Bus System.” The invention describes a method and device for reducing measurement errors. An engineering tool receives and parses a file from a system configurator tool to identify a value associated with a transformer setting for a process bus device. If the value is not found in the file, the method checks installation data. It stores the value when identified and marks it as missing when it cannot be found, visually notifying a technician. The value is also published to a remote database for process bus subscriber devices.

Career Highlights

The available information connects Anjana AR’s patent activity with Siemens Aktiengesellschaft and the development of tools for configuring process bus devices. The described invention focuses on identifying transformer-setting values and making missing information visible to technicians.

Collaborations

Anjana AR’s listed coworkers include Christian Liedtke and Igor Kogan.

Conclusion

Anjana AR’s patent work focuses on reducing measurement errors and improving the handling of transformer-setting data in process bus systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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