Menlo Park, CA, United States of America

Anirban Roy

This inventor holds 1 USPTO granted patent. Top assignee: Obayashi Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anirban Roy. Retrieved from https://idiyas.com/inventor/anirban-roy-63fr3n9r

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Anirban Roy: Innovator in Difference Recognition Technology

Introduction

Anirban Roy is a notable inventor based in Menlo Park, California. He has made significant contributions to the field of technology, particularly in the area of difference recognition systems. His innovative work has led to the development of a unique patent that showcases his expertise and creativity.

Latest Patents

Anirban Roy holds a patent titled "Difference Recognition Method and Difference Recognition System." This patent represents his innovative approach to recognizing differences in various applications, highlighting his technical skills and understanding of complex systems. He has 1 patent to his name, which reflects his commitment to advancing technology.

Career Highlights

Anirban Roy is currently employed at Obayashi Corporation, where he continues to work on cutting-edge projects. His role at the company allows him to apply his knowledge and skills in a practical setting, contributing to the development of innovative solutions in the industry.

Collaborations

Anirban has collaborated with Chih-Hung E Yeh, a fellow innovator, to enhance the scope and impact of their work. Their partnership exemplifies the importance of teamwork in driving technological advancements.

Conclusion

Anirban Roy is a dedicated inventor whose work in difference recognition technology has made a significant impact. His patent and ongoing contributions at Obayashi Corporation demonstrate his commitment to innovation and excellence in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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