Illkirch-Graffenstaden, France

Anila Hoskere Ashoka

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Centre National De La Recherche Scientifique, Institut De Recherche Contre Les Cancers De L'appareil Digestif Ircad, Universitéde Strasbourg. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anila Hoskere Ashoka. Retrieved from https://idiyas.com/inventor/anila-hoskere-ashoka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Anila Hoskere Ashoka: Innovator in Optical Imaging Applications

Introduction

Anila Hoskere Ashoka is an inventor based in Illkirch-Graffenstaden, France. She has made significant contributions to the field of optical imaging applications. Although she currently holds no granted patents, her innovative ideas are reflected in her patent applications.

Latest Patent Applications

Anila's notable patent application is titled "CALIBRATION AID FOR OPTICAL IMAGING APPLICATIONS." This application describes a calibration device designed for optical imaging applications. The device includes a body that forms separate areas, with a material applied to these areas. The material consists of at least one polymeric substance and at least one dye that is visible within a spectral range of wavelengths from 500 nm to 2000 nm. The polymer forms a continuous matrix, and the dye is homogeneously distributed within this matrix at a predetermined weight percentage. Notably, the weight percentage of the dye varies across the different areas of the device.

Conclusion

Anila Hoskere Ashoka is an emerging inventor whose work in optical imaging applications showcases her innovative spirit. Her patent application reflects her commitment to advancing technology in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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