Baldwin Place, NY, United States of America

Anil Jain

This inventor holds 1 USPTO granted patent. Top assignee: Oracle International Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anil Jain. Retrieved from https://idiyas.com/inventor/anil-jain-xk83w6ri

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Anil Jain - Innovator in Cost Management Systems

Introduction

Anil Jain is a notable inventor based in Baldwin Place, NY (US). He has made significant contributions to the field of cost management through his innovative patent. His work focuses on enhancing transaction efficiency and accuracy in cost determination.

Latest Patents

Anil Jain holds a patent for a "Cost management system with flexible unit of measure." This system is designed to determine the cost of a transaction by receiving a transaction for an item in a first unit of measure. The system then calculates the cost based on a second unit of measure, ensuring flexibility and precision in cost management.

Career Highlights

Anil Jain is currently employed at Oracle International Corporation, where he applies his expertise in developing advanced technological solutions. His role at Oracle allows him to contribute to innovative projects that enhance business operations and financial management.

Collaborations

Anil has collaborated with talented professionals such as Jatinder Gogna and Rajesh Seshadri. These collaborations have fostered a creative environment that encourages the development of cutting-edge solutions in the tech industry.

Conclusion

Anil Jain's contributions to cost management systems exemplify his innovative spirit and dedication to improving transaction processes. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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