Suwon-si, South Korea

Anhi Pyun

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anhi Pyun. Retrieved from https://idiyas.com/inventor/anhi-pyun-019yk6jl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Anhi Pyun: Inventor in Semiconductor Process Technology

Introduction

Anhi Pyun is an inventor based in Suwon-si, South Korea. His patent work concerns detecting and tracking impacts during semiconductor post-processing and transportation.

Latest Patents

Pyun is associated with 1 patent: “Semiconductor Post-Process Impact Detection Device, Semiconductor Post-Process Transportation System Including Same, and Impact Location Tracking Method Using Same.” The invention describes a detection body that moves along a distribution line and uses vibration and rotation detection units to monitor its movement. A controller processes the sensor signals and sends information about the detection body to a data transmission unit, which forwards it to a display. The device also includes an internal power supply. Together, these components support impact detection and location tracking in semiconductor post-process transportation.

Career Highlights

Pyun is associated with Samsung Electronics Ltd. His patent reflects work on monitoring equipment and transportation processes used in semiconductor manufacturing.

Collaborations

Taemin Lee and Dongsoo Lee are identified as Pyun’s coworkers. Their names are provided as professional associations, though specific roles in the patent are not stated.

Conclusion

Anhi Pyun’s patent focuses on detecting and tracking impacts in semiconductor post-processing transportation, highlighting an engineering approach to equipment monitoring in semiconductor manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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