Munich, Georgia

Angela Schindler


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Angela Schindler: Innovator in Optical Measurement Technologies

Introduction

Angela Schindler is a prominent inventor based in Munich, Germany. She has made significant contributions to the field of optical measurement technologies. Her innovative work focuses on the contactless determination of geometric and optical characteristics of products.

Latest Patents

Angela Schindler holds a patent for a method and arrangement for contactless determination of geometric and optical characteristics. This method is particularly useful in the continuous or discontinuous fabrication of layer systems formed of multiple layers with varying optical characteristics. The patent outlines a measuring apparatus and methods that adapt based on the optical characteristics of the layers being measured. The device employs multiple detectors for closely adjacent wavelength regions, allowing for comprehensive evaluation of light from the measurement surface across a wide range of wavelengths, from 200 nm to over 2400 nm.

Career Highlights

Angela Schindler is associated with Carl Zeiss Jena GmbH, a leading company in optical systems and measurement technologies. Her work at the company has been instrumental in advancing the capabilities of optical measurement devices.

Collaborations

Angela has collaborated with notable colleagues such as Matthias Patzwald and Rudolf Kessler. Their combined expertise has contributed to the development of innovative solutions in the field.

Conclusion

Angela Schindler's contributions to optical measurement technologies exemplify her role as a leading inventor in her field. Her innovative methods and collaborative efforts continue to push the boundaries of what is possible in optical measurements.

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