Stanford, CA, United States of America

Angad Singh Rekhi

This inventor holds 1 USPTO granted patent. Top assignee: Leland Stanford Junior University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Angad Singh Rekhi. Retrieved from https://idiyas.com/inventor/angad-singh-rekhi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Angad Singh Rekhi: Inventor in Remote Tag Detection

Introduction

Angad Singh Rekhi is an inventor associated with Leland Stanford Junior University in Stanford, California. His listed patent concerns a system for remotely detecting and locating tags by combining radio-frequency and ultrasonic technologies.

Latest Patents

Rekhi is credited with 1 patent: “Remote Parametric Detection and Localization of Tags.” The invention describes a tag with an antenna that receives a radio-frequency signal and reradiates it. An ultrasonic transducer coupled to the antenna responds to ultrasound by changing a property of the transducer. That change modulates at least part of the received radio-frequency signal, which the antenna then reradiates. The patent also describes related systems, methods, and articles of manufacture.

Career Highlights

The available information identifies Rekhi’s work with Leland Stanford Junior University and highlights his contribution to remote tag detection and localization. The patent’s approach links ultrasonic input with radio-frequency signal modulation, enabling a tag to respond to ultrasound through its reradiated signal.

Collaborations

Chun-Ming Ernest So is identified as Rekhi’s coworker. The provided information does not specify the nature or scope of their collaboration.

Conclusion

Angad Singh Rekhi’s listed patent presents a method of combining ultrasonic sensing and radio-frequency communication to support the remote detection and localization of tags.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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