This inventor holds 2 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Ams International Ag. Active years: 2025-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025-2026
Title: André Van Der Avoird: Inventor in SPAD-Based Radiation Sensing.
Introduction
André Van Der Avoird is an inventor based in Eindhoven, the Netherlands. His patent work focuses on extending the dynamic range of radiation-sensitive devices that use single-photon avalanche diodes (SPADs). He is associated with Ams International AG and has 2 patents listed in the information provided.
Latest Patents
Both of Van Der Avoird’s listed patents concern dynamic range extension in SPAD-based devices. They describe radiation-sensitive devices and methods that adapt how SPADs are read or used according to the intensity of incident radiation.
One approach adjusts the SPAD read-out rate in response to radiation intensity. This enables the device to accommodate changing light levels while measuring incoming radiation.
The other approach varies the number of SPADs used to determine radiation intensity. The disclosed technology also identifies potential applications in electronic-nose and point-of-care apparatuses, as well as ambient light sensing.
Career Highlights
Van Der Avoird’s listed inventions address a practical challenge in radiation sensing: maintaining useful measurements across different levels of incident radiation. His work combines SPAD arrays with circuitry or processing methods that respond to changing signal intensity.
Collaborations
The information provided lists Bobby Daniel and Jagruth Prasanna Kumar as Van Der Avoird’s coworkers. His company affiliation is Ams International AG.
Conclusion
André Van Der Avoird’s patent portfolio highlights approaches to improving the dynamic range of SPAD-based radiation-sensitive devices, with potential applications in sensing and measurement technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
