This inventor holds 1 USPTO granted patent. Top assignees: Semiconductor Diagostics, Inc., University of South Florida. Active years: 1997.
Company Filing History:
1 out of 1 
1 out of 1,985 
Years Active: 1997
Title: Andrzej Kontkiewicz: Innovator in Semiconductor Technology
Introduction
Andrzej Kontkiewicz is a notable inventor based in Warsaw, Poland. He has made significant contributions to the field of semiconductor technology, particularly in the area of minority carrier diffusion lengths. His innovative approach has led to advancements that enhance the accuracy of measurements in this critical domain.
Latest Patents
Kontkiewicz holds a patent for "Determining long minority carrier diffusion lengths." This invention addresses the challenges associated with measuring long diffusion lengths that exceed the thickness of the wafer. The techniques he developed minimize errors caused by lateral carrier diffusion, surface reflectivity, temperature variations, and limitations in standard computation methods. His probe design allows for the sensing of photovoltage in areas spaced from the edge of the illuminated region, providing measurements that are largely free from errors due to lateral carrier diffusion. Additionally, the probe can measure surface reflectivity simultaneously, which is particularly advantageous for analyzing wafers with dielectric coatings. He has 1 patent to his name.
Career Highlights
Throughout his career, Kontkiewicz has worked with various organizations, including Semiconductor Diagnostics, Inc. and the University of South Florida. His experience in these institutions has allowed him to refine his expertise and contribute to significant advancements in semiconductor research.
Collaborations
Kontkiewicz has collaborated with notable colleagues such as Jacek J Lagowski and Lubek Jastrzebski. These partnerships have fostered a collaborative environment that has furthered research and innovation in the field.
Conclusion
Andrzej Kontkiewicz's contributions to semiconductor technology, particularly through his patent on minority carrier diffusion lengths, highlight his role as an innovator in the field. His work continues to influence advancements in measurement techniques, showcasing the importance of innovation in technology.