Delft, Netherlands

Andries Gisolf



 

Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 2010-2017

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2 patents (USPTO):Explore Patents

Title: Andries Gisolf: Innovator in Ultrasound Inspection Technologies

Introduction

Andries Gisolf is a notable inventor based in Delft, Netherlands. He has made significant contributions to the field of ultrasound inspection technologies, holding 2 patents that showcase his innovative approaches to examining materials and structures.

Latest Patents

Gisolf's latest patents include a "Method for inspecting an object by means of ultrasound." This method involves transmitting ultrasonic pulses into an object to detect wall thickness or defects. The process includes receiving the ultrasonic pulse at different positions on the object's surface, generating data signals that represent the received pulses, and processing these signals to create a time-domain image. Another significant patent is the "Method and apparatus for examining the interior material of an object, such as a pipeline or a human body from a surface of the object using ultrasound." This method utilizes ultrasound frequencies of at least 100 KHz to examine the interior material, processing receiving signals to determine reflections and diffractions within the object.

Career Highlights

Throughout his career, Gisolf has worked with reputable organizations such as Rontgen Technische Dienst B.V. and Technische Universiteit Delft. His work has focused on advancing ultrasound technology for various applications, enhancing the ability to inspect and analyze materials effectively.

Collaborations

Gisolf has collaborated with notable colleagues, including Niels Pörtzgen and Xavier Georges Jose Deleye. These collaborations have contributed to the development and refinement of his innovative methods in ultrasound inspection.

Conclusion

Andries Gisolf's contributions to ultrasound inspection technologies reflect his dedication to innovation and excellence in the field. His patents and career achievements highlight the importance of advanced methods in material examination.

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