The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2017
Filed:
May. 03, 2010
Xavier Georges Jose Deleye, Rotterdam, NL;
Andries Gisolf, Delft, NL;
Adrianus Maria Cornelius Van Den Biggelaar, Lekkerkerk, NL;
Xavier Georges Jose Deleye, Rotterdam, NL;
Andries Gisolf, Delft, NL;
Adrianus Maria Cornelius Van Den Biggelaar, Lekkerkerk, NL;
RONTGEN TECHNISCHE DIENST B.V., Rotterdam, NL;
Abstract
A method for inspecting an object by ultrasound for detecting a wall thickness or defects of the object, wherein at least one ultrasonic pulse is transmitted into the object on a first position on an object's surface, the ultrasonic pulse is received on a second position on an object's surface possibly by propagating directly towards the second position along the surface or possibly as a result of reflection and/or diffractions of the pulse so that more than one pulse being received at different time and wherein a data signal is generated representing the received pulses and the associated moments in time wherein these pulses are received wherein the step is repeated for other positions and wherein the data signals are processed for generating processed signals to obtain a To FD image, wherein the processing for obtaining the processed data signals comprises at least three processing steps.