Bad Schoenborn, Germany

Andrey Martynov

This inventor holds 1 USPTO granted patent. Top assignee: Sap Se. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andrey Martynov. Retrieved from https://idiyas.com/inventor/andrey-martynov-bzost2dv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Andrey Martynov: Innovator in Data Replication Systems

Introduction

Andrey Martynov is a notable inventor based in Bad Schoenborn, Germany. He has made significant contributions to the field of data replication systems, showcasing his expertise through innovative solutions.

Latest Patents

Martynov holds a patent for "Maintenance events in a data replication system." This patent involves systems and methods that detect changes to data from multiple source objects in a source system. The process includes replicating these data changes to corresponding target objects. During this operation, the system detects changes, identifies maintenance events, determines solutions to resolve these events, and presents them to the user for execution.

Career Highlights

Andrey Martynov is currently employed at SAP SE, a leading enterprise software company. His work focuses on enhancing data management and replication processes, contributing to the efficiency and reliability of data systems.

Collaborations

Martynov collaborates with talented professionals such as Michael Haberkorn and Sebastian Haase. Their combined expertise fosters innovation and drives advancements in their projects.

Conclusion

Andrey Martynov's contributions to data replication systems exemplify his innovative spirit and dedication to improving technology. His patent and work at SAP SE highlight his role as a key player in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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