Livingston, NJ, United States of America

Andrew Young

This inventor holds 2 USPTO granted patents. Top assignee: Allstate Insurance Company. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andrew Young. Retrieved from https://idiyas.com/inventor/andrew-young-18mjdnhc

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Andrew Young: Inventor of a Geographical Risk Heatmap

Introduction

Andrew Young is an inventor based in Livingston, New Jersey, and is associated with Allstate Insurance Company. His patent work describes a system for visualizing geographical risk using variable factors.

Latest Patents

Young is named on one patent: “Geographical Risk Heatmap Based on Variable Risk Factors.” The invention describes aggregating data associated with a geographical location and assigning assets to regions within that location. It associates relevant data with each asset, calculates scores for different types of data, and combines those scores into an overall score. The system then displays the assets on a map as a heatmap, helping users visualize differences in risk across regions. Young’s reported portfolio includes 1 patent.

Career Highlights

Young’s listed patent highlights an approach to organizing location-based information and presenting risk assessments visually. By combining multiple data types into regional scores, the system can support analysis of how risk varies across a geographical area.

Collaborations

Young’s listed coworker is Sarah K. Webster. The patent information provided identifies Allstate Insurance Company as the company associated with his work.

Conclusion

Andrew Young’s patent describes a method for turning variable geographical data into a scored, map-based heatmap, reflecting his contribution to location-focused risk visualization.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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