Long Beach, CA, United States of America

Andrew Taormina

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Relativity Space, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andrew Taormina. Retrieved from https://idiyas.com/inventor/andrew-taormina

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Andrew Taormina: Patent Work in Automated Defect Recognition

Introduction

Andrew Taormina is an inventor based in Long Beach, California, and is associated with Relativity Space, Inc. His patent work addresses automated analysis of radiographic images to identify and assess pore defects in manufactured articles.

Latest Patents

The available information lists one patent for Taormina: “Automated Defect Recognition and Determinations of Pore Cluster Compliance.” The described process obtains a radiographic (RT) image of an article, identifies overlapping image portions, and classifies their pixels using a pore classification model. It then generates a pore map, maps that information onto the article using sensor data, identifies regions that exceed rejection thresholds under predefined rules, and displays those regions. This approach is intended to support consistent defect recognition and compliance assessment.

Career Highlights

Taormina’s listed patent reflects work at the intersection of imaging, automated classification, and manufacturing quality assessment. His association with Relativity Space connects this work to a company operating in the aerospace sector.

Collaborations

The provided information names Christopher Sacco and Viraj Sinha as Taormina’s coworkers. It does not specify their roles in the patent or describe any direct collaboration with him.

Conclusion

Andrew Taormina’s listed invention applies automated image analysis to pore detection and compliance review, highlighting a practical use of patent innovation in manufacturing inspection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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