San Mateo, CA, United States of America

Andrew Skrei

This inventor holds 1 USPTO granted patent. Top assignee: Exabeam, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andrew Skrei. Retrieved from https://idiyas.com/inventor/andrew-skrei

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Andrew Skrei and Cybersecurity Detection Assessment.

Introduction

Andrew Skrei is an inventor based in San Mateo, California. His patent work addresses how organizations can evaluate whether cybersecurity systems are effectively meeting detection objectives.

Latest Patents

Skrei is associated with 1 patent: “System, Method, and Computer Program for Assessing a Cybersecurity System’s Ability to Satisfy a Detection Objective.” The invention describes a system that identifies the measures used to implement a cybersecurity detection objective and periodically scores how effectively the system performs each measure. It compares relevant fields with fields extracted by parsers during a defined time window, then combines the measure scores into an objective score. This score provides an assessment of the system’s operational effectiveness across the measures during that period.

Career Highlights

Skrei is associated with Exabeam, Inc., a company focused on cybersecurity. His patent reflects an approach to measuring detection performance through recurring, data-based assessments of individual measures and overall objectives.

Collaborations

The provided information identifies Adam Geller and Ananta Vadlamani as Skrei’s coworkers. Their inclusion indicates professional connections, but no specific joint patent or collaboration details were provided.

Conclusion

Andrew Skrei’s patent focuses on systematically assessing cybersecurity detection capabilities, connecting the performance of individual measures to an overall evaluation of whether a detection objective is being met.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…