New York, NY, United States of America

Andrew Robert Burton

This inventor holds 1 USPTO granted patent. Top assignee: University of Michigan. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andrew Robert Burton. Retrieved from https://idiyas.com/inventor/andrew-robert-burton

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Andrew Robert Burton and Flexible Strain-Sensing Technology

Introduction

Andrew Robert Burton is an inventor associated with the University of Michigan in New York, NY (US). His work includes a patent for a flexible, thin-film strain sensor designed to detect deformation through changes in its radio-frequency response.

Latest Patents

Burton is identified with 1 patent: “Conformable Thin Film-Based Strain Sensing with Flexible Substrate.” The invention describes a strain sensor built on a flexible substrate, with a circuit that receives an excitation signal through an inductance and generates a radio-frequency response.

An elongated trace connected to the inductance bends and stretches as the substrate deforms. A deliberately designed non-uniformity causes the trace to deform and tear when strain reaches a threshold, producing a nonlinear increase in electrical resistance. That resistance change modifies a characteristic of the circuit’s radio-frequency response, enabling strain detection.

Career Highlights

The patent reflects Burton’s contribution to research on conformable sensing systems. By combining a flexible substrate, an inductive circuit, and a strain-responsive trace, the design offers a way to monitor deformation through wireless radio-frequency measurements.

Collaborations

Burton’s listed coworkers include Jerome P. Lynch and Peng Sun. The patent is associated with the University of Michigan.

Conclusion

Andrew Robert Burton’s patented work brings together flexible materials and radio-frequency sensing to detect strain, highlighting an approach to monitoring deformation with a conformable thin-film device.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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