Deer Park, NY, United States of America

Andrew Louis Baranek

This inventor holds 1 USPTO granted patent. Top assignee: Deephaven Data Labs, LLC. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andrew Louis Baranek. Retrieved from https://idiyas.com/inventor/andrew-louis-baranek

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: The Innovations of Andrew Louis Baranek

Introduction

Andrew Louis Baranek is an accomplished inventor based in Deer Park, NY (US). He has made significant contributions to the field of data processing through his innovative ideas and patents. His work primarily focuses on enhancing the efficiency of data selection methods.

Latest Patents

Andrew holds a patent for "Keyed Row Selection." This patent describes methods, systems, and computer-readable media for keyed row data selection and processing. His invention aims to streamline data handling processes, making them more efficient and effective.

Career Highlights

Andrew is currently employed at Deephaven Data Labs, LLC, where he continues to develop cutting-edge solutions in data analytics. His expertise in data processing has positioned him as a valuable asset to the company and the industry.

Collaborations

Andrew has collaborated with notable colleagues, including Charles P. Wright and Ryan Caudy. These partnerships have fostered a creative environment that encourages innovation and the development of new technologies.

Conclusion

Andrew Louis Baranek is a notable inventor whose work in data processing has led to significant advancements in the field. His patent for keyed row selection exemplifies his commitment to innovation and efficiency in data handling.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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