This inventor holds 1 USPTO granted patent. Top assignee: Moxtek, Inc.. Active years: 1996.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1996
Title: The Innovative Contributions of Andrew J Nielsen
Introduction
Andrew J Nielsen is a notable inventor based in Orem, UT (US). He has made significant contributions to the field of analysis instruments through his innovative designs. With a focus on enhancing the efficiency of micro-sample analysis, Nielsen's work has garnered attention in the scientific community.
Latest Patents
Nielsen holds a patent for a "Thin film sample support." This invention is a holder designed for micro-samples used with analysis instruments that rely on a beam of radiation or accelerated particles. The patent describes a holder that includes a frame with one or more orifices covered by a thin polymer film. Additionally, one or more concave impressions are formed in the thin polymer film at precise positions where samples can be placed to intersect a probe beam during analysis. This innovative design improves the accuracy and efficiency of sample analysis.
Career Highlights
Nielsen is currently employed at Moxtek, Inc., a company known for its advancements in x-ray and optical technologies. His work at Moxtek has allowed him to apply his inventive skills in a practical setting, contributing to the development of cutting-edge analytical instruments.
Collaborations
Throughout his career, Nielsen has collaborated with talented individuals such as D Clark Turner and Raymond T Perkins. These collaborations have fostered an environment of innovation and creativity, leading to the development of impactful technologies.
Conclusion
Andrew J Nielsen's contributions to the field of analysis instruments through his patent for a thin film sample support exemplify his innovative spirit. His work at Moxtek, Inc. and collaborations with other professionals highlight his commitment to advancing technology in scientific analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile