Aliso Viejo, CA, United States of America

Andres Dandler

This inventor holds 4 USPTO granted patents. Top assignee: Meade Instruments Corporation. Active years: 2004-2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andres Dandler. Retrieved from https://idiyas.com/inventor/andres-dandler-9b576n70

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.7

ph-index = 4

Forward Citations = 47(Granted Patents)


Company Filing History:


Years Active: 2004-2005

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4 patents (USPTO):Explore Patents

Title: The Innovative Journey of Andres Dandler

Introduction

Andres Dandler is a notable inventor based in Aliso Viejo, California. He has made significant contributions to the field of optics and imaging technology. With a total of 4 patents to his name, Dandler continues to push the boundaries of innovation.

Latest Patents

One of his latest inventions is a unique combination of binoculars and a camera. This innovative device allows users to capture high-quality images while enjoying the benefits of binocular vision. Dandler's work exemplifies the integration of traditional optical devices with modern imaging technology.

Career Highlights

Andres Dandler is currently employed at Meade Instruments Corporation, a company renowned for its advancements in telescopes and optical instruments. His role at Meade Instruments has allowed him to further develop his ideas and bring them to fruition.

Collaborations

Throughout his career, Dandler has collaborated with talented individuals such as David M. Hines and Jaime Canedo. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Andres Dandler's contributions to the field of optics and imaging technology highlight his dedication to innovation. His work continues to inspire future inventors and shape the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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