This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: “Stc-Mt” LLC. Active years: 2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2018
Title: Andrei Nikolaevich Putilin: Innovator in Scintillation Detection Technology
Introduction
Andrei Nikolaevich Putilin is a prominent inventor based in Moscow, Russia. He has made significant contributions to the field of scintillation detection technology. His innovative work focuses on methods for forming structured scintillators, which are crucial for detecting X-ray and gamma radiation.
Latest Patents
Putilin holds a patent for a scintillation detector and a method for forming a structured scintillator. This invention relates to techniques for depositing fluorescent coatings on screens used for image detection and conversion. The patent outlines methods for creating structured scintillators on the surface of photodetectors, which are essential for obtaining X-ray images and detecting gamma radiation. The proposed methods enhance manufacturability while expanding the applications of scintillation detectors.
Career Highlights
Putilin is associated with “Stc-Mt” LLC, where he continues to develop and refine his inventions. His work has been instrumental in advancing technologies used in medical imaging, particularly in X-ray mammography and tomosynthesis. His innovative approaches have garnered attention in the scientific community.
Collaborations
Putilin has collaborated with notable colleagues, including Dmitry Aleksandrovich Suponnikov and Anatoliy Rudolfovich Dabagov. These partnerships have contributed to the development of advanced technologies in the field of radiation detection.
Conclusion
Andrei Nikolaevich Putilin is a key figure in the innovation of scintillation detection technology. His contributions have the potential to significantly impact medical imaging and radiation detection applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile