DE

Andreas Woerz

This inventor holds 0 USPTO granted patents, plus 1 CIPO patent.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andreas Woerz. Retrieved from https://idiyas.com/inventor/andreas-woerz-vipns38i

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

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Title: The Innovations of Andreas Woerz

Introduction

Andreas Woerz is a notable inventor based in Germany. He has made significant contributions to the field of machine monitoring and control. His innovative approach focuses on enhancing the efficiency and functionality of machines through advanced technology.

Latest Patents

Andreas Woerz holds a patent for a device designed for monitoring and controlling a machine. This invention relates to a device that incorporates at least two sensors for recording measurement variables, particularly motion variables. The device features an electronic control loop for evaluating the recorded measurement variables and correspondingly controlling machine components, allowing for the influence of these measurement variables.

Career Highlights

Woerz is associated with Rampf Formen GmbH, where he applies his expertise in machine technology. His work has been instrumental in developing solutions that improve machine performance and reliability. Despite having no patents to his name, his contributions to the field are noteworthy.

Collaborations

Throughout his career, Andreas has collaborated with notable colleagues such as Gottfried Keller and Heinrich Walk. These partnerships have fostered an environment of innovation and creativity, leading to advancements in machine technology.

Conclusion

Andreas Woerz is a dedicated inventor whose work in machine monitoring and control showcases his commitment to innovation. His contributions, although not reflected in a large number of patents, demonstrate his impact on the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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