Wolnzach, Germany

Andreas Schels

This inventor holds 1 USPTO granted patent. Top assignee: Ketek Gmbh Halbleiter-Und Reinraumtechnik. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andreas Schels. Retrieved from https://idiyas.com/inventor/andreas-schels

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovations of Andreas Schels

Introduction

Andreas Schels is a notable inventor based in Wolnzach, Germany. He has made significant contributions to the field of X-ray technology. His work has led to the development of innovative devices that enhance the capabilities of X-ray apparatuses.

Latest Patents

Andreas Schels holds a patent for an X-ray apparatus, an electron emission device, and a manufacturing method. This invention includes an X-ray source configured for generating X-rays and an X-ray detector designed for detecting X-rays. The apparatus features a housing that contains either the X-ray source or the detector, with an opening covered by a window. This window is designed to allow X-rays to pass through and comprises a transmission layer made of glassy carbon.

Career Highlights

Andreas Schels is associated with Ketek GmbH Halbleiter-Und Reinraumtechnik, where he applies his expertise in developing advanced X-ray technologies. His work at the company has been instrumental in pushing the boundaries of what is possible in X-ray imaging and detection.

Collaborations

Andreas has collaborated with notable colleagues, including Michael Bachmann and Simon Edler. Their combined efforts contribute to the innovative projects at Ketek GmbH.

Conclusion

Andreas Schels is a prominent figure in the field of X-ray technology, with a patent that showcases his innovative approach to enhancing X-ray apparatuses. His contributions continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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