Vandans, Austria

Andreas Scheidl

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Liebherr-Werk Nenzing Gmbh. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andreas Scheidl. Retrieved from https://idiyas.com/inventor/andreas-scheidl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2011

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Andreas Scheidl

Introduction

Andreas Scheidl is a notable inventor based in Vandans, Austria. He has made significant contributions to the field of mechanical measurement through his innovative patent. His work focuses on developing devices that enhance the accuracy and efficiency of measuring mechanical quantities.

Latest Patents

Scheidl holds a patent for a "Device for measuring mechanical quantities, method for measuring mechanical quantities and use of a device for measuring mechanical quantities." This invention is particularly aimed at detecting tensile forces, thrust forces, and bending deformations. The device represents a significant advancement in the field of mechanical engineering.

Career Highlights

Andreas Scheidl is associated with Liebherr-Werk Nenzing GmbH, a company known for its engineering excellence. His role at the company has allowed him to apply his innovative ideas in practical settings, contributing to the development of advanced measurement technologies.

Collaborations

Scheidl has worked alongside esteemed colleagues such as Josef Kaspar Schmid and Klaus Schneider. Their collaborative efforts have furthered the research and development of mechanical measurement devices.

Conclusion

Andreas Scheidl's contributions to the field of mechanical measurement are noteworthy. His innovative patent and collaboration with skilled professionals highlight his commitment to advancing technology in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…