Eugene, OR, United States of America

Andreas M Wenzel

This inventor holds 1 USPTO granted patent and 1 published patent application, plus 1 CIPO patent. Top assignee: Suprasensor Technologies, LLC. Active years: 2020.

USPTO Granted Patents = 1 

% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2020

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Innovations of Andreas M Wenzel

Introduction

Andreas M Wenzel is an accomplished inventor based in Eugene, OR (US). He has made significant contributions to the field of ion concentration measurement technology. His innovative work has led to the development of a portable ion concentration apparatus that enhances the accuracy and efficiency of measuring ion levels in various media.

Latest Patents

Wenzel holds a patent for a "System, apparatus, and method for measuring ion concentration with a standard deviation correction." This invention includes a portable ion concentration apparatus featuring a controller, a storage section for data samples, an amplifier circuit, and a chemical field effect transistor (CHEMFET). The apparatus is designed to indicate nitrate levels in sample media, allowing for precise analysis and monitoring.

Career Highlights

Wenzel is currently associated with Suprasensor Technologies, LLC, where he continues to innovate in the field of sensor technology. His work focuses on developing advanced methods for measuring ion concentrations, which are crucial for various applications in environmental monitoring and agricultural practices.

Collaborations

Wenzel collaborates with talented individuals such as Jordan Richard Kusiek and Calden Carroll Stimpson, contributing to a dynamic team that drives innovation in sensor technology.

Conclusion

Andreas M Wenzel's contributions to ion concentration measurement technology exemplify the impact of innovative thinking in scientific advancements. His work continues to pave the way for more accurate and efficient measurement methods in various fields.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…