Heerbrugg, Switzerland

Andreas Klopfer

This inventor holds 5 USPTO granted patents. Top assignee: Leica Instruments (Singapore) Pte. Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andreas Klopfer. Retrieved from https://idiyas.com/inventor/andreas-klopfer-2zbtiuj6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0


Company Filing History:


Years Active: 2026

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5 patents (USPTO):Explore Patents

Title: Innovations by Andreas Klopfer

Introduction

Andreas Klopfer is a notable inventor based in Heerbrugg, Switzerland. He has made significant contributions to the field of microscopy, holding a total of 5 patents. His work has been instrumental in advancing the technology used in microscopes, particularly through the integration of modern features.

Latest Patents

Among his latest patents are innovative designs such as a microscope with an integrated camera and a camera insert specifically designed for microscopes. These inventions enhance the functionality and usability of microscopy equipment, making it easier for researchers and professionals to capture high-quality images.

Career Highlights

Andreas Klopfer is currently employed at Leica Instruments (Singapore) Pte. Ltd., where he continues to develop cutting-edge technologies in microscopy. His expertise and innovative mindset have positioned him as a key player in the industry.

Collaborations

He has collaborated with talented coworkers, including Patrick Grimmel and Marc Burghoff, to further enhance the capabilities of their products and drive innovation within the company.

Conclusion

Andreas Klopfer's contributions to microscopy through his patents and collaborative efforts highlight his importance in the field of innovation. His work continues to influence the way microscopy is utilized in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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