This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Dr. Johannes Heidenhain Gmbh. Active years: 2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2021
Title: The Innovations of Andreas Hofmann
Introduction
Andreas Hofmann is a notable inventor based in Rosenheim, Germany. He has made significant contributions to the field of optical position measuring devices. His innovative work has led to the development of a unique scanning reticle that enhances measurement accuracy.
Latest Patents
Hofmann holds a patent for a "Scanning reticle including a grating formed in a substrate for an optical position measuring device." This invention features a substrate with an upper surface that operates in transmission and includes various functional regions. The upper surface is designed with at least one region containing a grating made up of gaps and ribs, which are formed in the substrate. Additionally, the upper surface is equipped with an antireflection layer that is discontinuous in the region of the gaps. This innovative design improves the performance of optical position measuring devices.
Career Highlights
Andreas Hofmann is associated with Dr. Johannes Heidenhain GmbH, a company known for its precision measurement technology. His work at this esteemed organization has allowed him to focus on advancing optical measurement solutions. Hofmann's dedication to innovation has positioned him as a key figure in his field.
Collaborations
Throughout his career, Hofmann has collaborated with talented colleagues, including Stefan Funk and Peter Speckbacher. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.
Conclusion
Andreas Hofmann's contributions to optical position measuring devices exemplify the spirit of innovation. His patent and work at Dr. Johannes Heidenhain GmbH highlight his commitment to advancing technology in this field. His collaborations further enhance the impact of his inventions, making him a significant figure in the world of optical measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
