Wiesbaden, Germany

Andreas Frank

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Smiths Heimann Gmbh. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andreas Frank. Retrieved from https://idiyas.com/inventor/andreas-frank-3djj8m0r

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Innovations by Andreas Frank in Freight Inspection Technology.

Introduction

Andreas Frank is a notable inventor based in Wiesbaden, Germany. He has made significant contributions to the field of freight inspection technology. His innovative approach has led to the development of a unique facility designed for inspecting large-volume goods.

Latest Patents

Andreas Frank holds a patent for a "Facility for inspecting large-volume goods, in particular freight goods." This facility utilizes an X-ray source to irradiate the goods, coupled with a detector arrangement that is strategically aligned with the X-ray source. The design features detector rows with two limbs that meet at right angles, optimizing the inspection process for goods in motion.

Career Highlights

Frank is associated with Smiths Heimann GmbH, a company known for its advanced inspection technologies. His work has focused on enhancing the efficiency and accuracy of freight inspections, which is crucial for various industries.

Collaborations

Throughout his career, Andreas has collaborated with esteemed colleagues such as Bernd Bartscher and Rainer Henkel. These partnerships have fostered innovation and have contributed to the success of their projects.

Conclusion

Andreas Frank's contributions to freight inspection technology exemplify the impact of innovative thinking in enhancing operational efficiency. His patent reflects a commitment to improving safety and accuracy in the inspection of large-volume goods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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