Alsfeld, Germany

Andreas Frank

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Heimann Systems Gmbh. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Andreas Frank. Retrieved from https://idiyas.com/inventor/andreas-frank-25ew738p

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 175(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Andreas Frank

Introduction

Andreas Frank is a notable inventor based in Alsfeld-Leusel, Germany. He has made significant contributions to the field of X-ray technology, particularly with his innovative patent for an X-ray detecting apparatus. His work has implications for better material determination in various applications.

Latest Patents

Andreas Frank holds a patent for an X-ray detecting apparatus. The detector materials of a low energy detector and a high energy detector are coordinated with one another to permit better separation of lower and higher energy fractions of polychromatic X-ray (X′) radiation. This innovation allows for a more accurate determination of the material of an object through which the X-rays are passed. Consequently, a negligible persistence in comparison with the integration time between two detector readings is achieved.

Career Highlights

Throughout his career, Andreas Frank has worked with prominent companies in the field, including Heimann Systems GmbH and Smiths Heimann GmbH. His experience in these organizations has contributed to his expertise and the development of his patented technology.

Collaborations

Andreas has collaborated with notable colleagues such as Patricia Schall and Georg Geus. Their teamwork has likely played a role in advancing the innovations in X-ray detection technology.

Conclusion

Andreas Frank's contributions to X-ray technology through his patent for an X-ray detecting apparatus demonstrate his innovative spirit and commitment to improving material determination. His work continues to influence the field and showcases the importance of collaboration in technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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