Eningen, Germany

Andreas Conzelmann


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: **Innovative Contributions of Andreas Conzelmann in Optical Spectrum Analysis**

Introduction

Andreas Conzelmann, an inventive mind from Eningen, Germany, has made significant strides in the field of optical spectrum analysis. His expertise has led to the development of a novel arrangement that enhances the simultaneous analysis of several optical lines, paving the way for advancements in various research and commercial applications.

Latest Patents

Conzelmann holds a notable patent titled "Arrangement for simultaneous analysis of several optical lines." This innovative optical spectrum analyzer enables the measurement and analysis of multiple different spectra at the same time. The design includes a measuring signal that serves as a reference signal for the calibration of the device. Light rays are admitted through a coupling device with multiple apertures arranged in a line and are decoupled via a separate decoupling device. A unique height offset is achieved using a 90-degree deviation prism, which allows for minimal retroreflection and uninterrupted calibration during the measuring process.

Career Highlights

Andreas Conzelmann is associated with Wavetek Wandel Goltermann Eningen GmbH & Co., where he employs his skills in optical engineering to push the boundaries of what is possible in spectral analysis. His work exemplifies a commitment to excellence and innovation, driving forward the capabilities of the technologies utilized in his industry.

Collaborations

Throughout his career, Conzelmann has collaborated with esteemed colleagues like Karl Benzel and Thomas Fuhrmann. These partnerships have allowed him to blend diverse expertise and ideas, further enhancing the impact of his work in optical analysis and beyond.

Conclusion

Andreas Conzelmann’s contributions to the field of optical spectrum analysis demonstrate his innovative spirit and dedication to advancing technology. With a patented solution that optimizes the measurement and analysis of optical lines, his work continues to influence the ongoing development in this important area of research and application.

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