Company Filing History:
Years Active: 1997
Title: Andrea Peratello: Innovator in Automated Quality Control for Semiconductor Wafers
Introduction
Andrea Peratello is a notable inventor based in Barengo, Italy. She has made significant contributions to the field of semiconductor manufacturing, particularly in the area of quality control during wafer slicing. Her innovative approach has the potential to enhance the efficiency and reliability of semiconductor production.
Latest Patents
Andrea holds a patent for a "Method and apparatus for automated quality control in wafer slicing." This invention focuses on an internal diameter saw designed to maintain quality control of semiconductor wafers sliced from an ingot of source material. The saw features a controller that monitors the deflection of the cutting edge of the blade during the slicing process. When deflection is detected, a blade dressing device is automatically activated to sharpen the blade, ensuring optimal performance and quality.
Career Highlights
Andrea is currently employed at MEMC Electronic Materials, Inc., where she applies her expertise in semiconductor technology. Her work has been instrumental in advancing the methods used in wafer slicing, contributing to the overall improvement of semiconductor manufacturing processes.
Collaborations
Andrea collaborates with her coworker, Fabrizio Leoni, to further enhance the innovations in their field. Together, they work on projects that aim to improve the quality and efficiency of semiconductor production.
Conclusion
Andrea Peratello's contributions to automated quality control in wafer slicing exemplify her commitment to innovation in the semiconductor industry. Her patent and ongoing work at MEMC Electronic Materials, Inc. highlight her role as a key player in advancing technology in this critical field.