This inventor holds 1 USPTO granted patent. Top assignee: Ecole De Technologie Superieure. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: André Dionne: Inventor in Nondestructive Testing
Introduction
André Dionne is an inventor associated with École de technologie supérieure in Montreal, Canada. His patent work concerns nondestructive testing methods for assessing structures and detecting defects.
Latest Patents
The available information lists one patent for Dionne: “Nondestructive Testing System and Method Using Reflected Shear Horizontal Guided Waves.” The invention describes driving an ultrasonic probe to send shear horizontal guided waves through a structure and receiving reflected signals. By comparing a reflected signal’s amplitude with a threshold, the system determines the structure’s thickness and uses that result to detect whether defects are present. Dionne is credited with 1 patent.
Career Highlights
Dionne’s listed patent reflects work in ultrasonic inspection and structural evaluation. The method uses reflected guided waves to assess thickness and identify potential defects without destructive testing.
Collaborations
The supplied information names Pierre Belanger and Aurélien Thon as Dionne’s coworkers. His listed organizational affiliation is École de technologie supérieure.
Conclusion
André Dionne’s patent focuses on using reflected shear horizontal guided waves to measure structural thickness and support nondestructive defect detection.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile